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X-Ray Coating Weight Gauge (Model HF3)

Original price $0.00 - Original price $0.00
Original price
$0.00 - $0.00
Current price $0.00

The X-Ray Coating Weight Gauge (Model HF3) involves the use of X-ray fluorescence (XRF) spectroscopy. In this method, X-rays are directed onto the coating and substrate, and the X-rays that are emitted from the sample are analyzed to determine the composition and thickness of the coating.

The principle behind XRF is that the energy of the X-rays that are emitted from the sample is related to the thickness and composition of the coating. The energy of the X-rays is measured and used to calculate the thickness of the coating. XRF is a non-destructive method of coating thickness measurement and is suitable for a wide range of coatings, including metals and ceramics. It is often used in production lines to ensure that coatings are within specified thickness limits.

Scantech offers the most modern algorithms, advanced system hardware and software in the industry.

HF3 Brochure