X-Ray Coating Weight Gauge (Model HF3)
The X-Ray Coating Weight Gauge (Model HF3) involves the use of X-ray fluorescence (XRF) spectroscopy. In this method, X-rays are directed onto the coating and substrate, and the X-rays that are emitted from the sample are analyzed to determine the composition and thickness of the coating.
The principle behind XRF is that the energy of the X-rays that are emitted from the sample is related to the thickness and composition of the coating. The energy of the X-rays is measured and used to calculate the thickness of the coating. XRF is a non-destructive method of coating thickness measurement and is suitable for a wide range of coatings, including metals and ceramics. It is often used in production lines to ensure that coatings are within specified thickness limits.
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